Carl Zeiss AG SUPRA 25 FE-SEM with Oxford EDAX XMAX80 INCA
Carl Zeiss AG SIGMA HD VP FE-SEM with Oxford EDAX XMAX80 INCA
A SEM (Scanning Electron Microscope) can be utilized for high magnification imaging of almost all materials. With SEM in combination with EDX (Energy Dispersive X-Ray Spectroscopy) it is also possible to find out which elements are presented in the area being viewed. A SEM-EDX is a powerful problem-solving instrument to not only identify but also quantify the elemental composition as part of a failure analysis.
Ultra-high resolution over the full high voltage range
High probe current for fast X-Ray analysis and mapping
Combine Scanning electron microscopy and elemental analytics: Oxford XMAX80 EDX.
Short analytical working distance of 8.5 mm for simultaneous high-resolution imaging and X-Ray analysis
Quick, “first look” compositional analysis
Get analytical data at half the probe current and twice the speed
Achieve complete, shadow-free analytics in FE-SEM. Profit from using a short analytical working distance of
8.5 mm and a take-off angle of 35°
Obtain crisp images in variable pressure mode with the VPSE
ALS Thailand offers qualitative and semi-quantitative analysis by SEM/ EDX to surfaces of solid samples for the identification of contaminants, internal structure of Electronics devices as well as determination of coating thickness by cross-section (destructive).